摘要
文中研究了用离子减薄法制备NICALON(SiC)/A1预制丝的透射电镜(TEM)样品。结果表明:用离子减薄法制备含有性质非常不同的组元(如碳化硅-铝复合材料)TEM样品是一种方便、有效的方法。运用TEM初步分析了所制出的预制丝样品。
In this paper, the preparation of the Transmission Electron Microscope(TEM) sample of NICALON (SiC)/Al preformed wires has been studied bymeans of Argon Ion Thinning technique. The result has shown that it is aconvienient and effective method to prepare the TEM sample which containsthe components with very different properties, such as the compostes ofsilicon carbide-aluminium. The sample of the preformed wires fabricated bythe AIT method has preliminary been analyzed with the TEM.
出处
《国防科技大学学报》
EI
CAS
CSCD
北大核心
1989年第2期107-111,共5页
Journal of National University of Defense Technology
关键词
复合材料
碳化硅
铝
TEM样品
composite material
metal matrix composites
silicon carbide-aluminium
TEM sample
Ion-Thinning
