摘要
评述了化学力显微镜的新成果。对自组装单分子膜修饰扫描探针显微镜针尖，生物分子修饰原子力显微镜针尖，电化学方法修饰扫描隧道显微镜针尖，纳米碳管材料修饰原子力显微镜针尖等作了介绍。
A review is given on the recent development of scanning probe microscope (SPM) tip modification techniques for chemical force microscope, including the preparation and application of SPM tip modified by self-assembled menolayer, atomic force microscope (AFM) tip modified by biological moelecule, scanning tunneling microscope tip modified by electrochemical method, AFM tip modified by carbon nanotube.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
2000年第5期644-648,共5页
Chinese Journal of Analytical Chemistry
基金
国家自然科学基金
关键词
化学力显微镜
扫描探针显微镜
针法修饰技术
Chemical force microscope, scanning probe microscope, atomic force microscope, scanning tunneling microscope, self-assembled monolayer, review
