摘要
分析了组合逻辑电路中"1"型竞争冒险、"0"型竞争冒险的产生条件,基于探索竞争冒险仿真实验技术的目的,采用Multisim10仿真软件对组合逻辑电路竞争冒险的工作波形进行了仿真实验测试,给出了Multisim仿真实验方案,仿真结果生动地展示了竞争冒险的产生过程.所述方法的创新点是解决了组合逻辑电路竞争冒险的工作波形无法用电子实验仪器进行分析验证的问题.
The prerequisites of ＂1＂ type and ＂0＂ type race and hazard in combinational logic circuit were analyzed. With the purpose of exploring simulation experiment technology, waveforms of race and hazard in combinational logic circuit were tested based on Multisim. The scenario of simulation was, provided and the results of simulation experiment vividly revealed the procedure of race and hazard. This method settles the problem that the waveforms of race and hazard in combinational logic circuit cannot be analyzed and verified by electronic devices.
出处
《渤海大学学报（自然科学版）》
CAS
2012年第2期120-124,共5页
Journal of Bohai University:Natural Science Edition
基金
2011年渤海大学教学改革A类项目(No:BDJG2011-A010)
