摘要
为了实现闭环Boost电路中电解电容的故障预测,本文采用基于特征参数退化的方法,利用LS-SVM及LS算法对电解电容的特征参数序列进行预测,实现了电解电容的故障预测与剩余寿命估计.仿真及物理实验均证明了本文方法的有效性及准确性.
In order to realize failure prediction of capacitors in close-loop boost circuit,a method was adopted based on the degradation of characteristic parameter using LS-SVM and LS algorithm.As a result,the trend of characteristic parameters was predicted which realized the fault prediction and residual life estimation of the capacitor.Simulation and experiment result all proved the accuracy and effectiveness of the method.
出处
《佳木斯大学学报（自然科学版）》
CAS
2012年第2期205-208,212,共5页
Journal of Jiamusi University：Natural Science Edition
基金
江苏省研究生科研创新计划项目(CX10B_098Z)
南京航空航天大学基本科研业务费专项科研项目(NS2010063)
关键词
闭环Boost电路
特征参数
电解电容
故障预测
power electronic circuit
close-loop boost circuit
characteristic parameter
electrolytic capacitor
fault prediction
