摘要
针对CCD等焦面阵列光电器件常被置于积分球辐射光源出口平面进行测试的误区,研究了积分球辐射光源照度分布的均匀性,得到了合理使用积分球光源测试光电器件的依据。基于数值解析方法和蒙特卡罗方法,建立了理想积分球辐射光源照度均匀性数学模型和非理想积分球辐射光源照度均匀性仿真模型,分析了与积分球光源出口不同距离处光电器件受光面上照度分布情况,并实验测试了两套积分球辐射光源照度分布情况,得到了与积分球辐射光源不同距离处光电器件受光面上照度均匀性分布规律。研究表明:当光电器件受光面直径小于积分球光源出口直径一半、光电器件和积分球出口之间的距离与积分球出口直径的比值在3至5之间时,可在光电器件受光面上获得均匀性优于99%的照度场。
Regarding to the mistake that the focal plane array optoelectronic devices such as CCD were often placed on the exit port plane of integrating sphere source to perform calibration,the output irradiance uniformity of integrating sphere source was analyzed,and the basis on which the integrating sphere source was used rationally to calibrate the optoelectronic devices was obtained.Two theoretical output irradiance uniformity models based on numerical analysis method and Monte Carlo method were developed respectively.The models considered two fundamental situations of integrating sphere sources,namely ideal Lambertian source and non-ideal Lambertian source.The distribution regularity of irradiance uniformity was generalized by contrast of the theoretical data obtained by the models and the measured data obtained by two different actual integrating sphere sources.The results show that when the diameter of optoelectronic device is less than the half of the sphere exit port diameter and the ratio of the distance between device and exit port to the exit port diameter is 3～5,a 99% better output irradiance uniformity can be obtained.
出处
《应用光学》
CAS
CSCD
北大核心
2012年第3期548-553,共6页
Journal of Applied Optics
关键词
光学测试
积分球
照度均匀性
光电器件
标定
optical measurement
integrating sphere
irradiance uniformity
optoelectronic device
calibration
