摘要
介绍了一种VLSI功能测试生成的结构分析法。它采用Petri网作为测试序列的模型工具,通过简化Petri网选择不确定度最小的测试序列,以降低测试序列的复杂度。
An approach of structural analysis is proposed for generation of functional test of VLSIs.In the approach,Petri net is employed as a model for test actions,and a number of properties of test actions,such as ambiguity,are proved.Such Properties are useful for identification of optimal test actions through simplification of the Petri net.Optimization at a given abstract level allows to make use of the simplified graphs.And optimization at finer detail can always make use of reductions performed at higher level,thereby to reduce complexity and computing time for test actions.
出处
《微电子学》
CAS
CSCD
北大核心
2000年第1期40-49,共10页
Microelectronics
关键词
VLSI
计算机
功能测试
集成电路
VLSI
Functional test
Computer aided test
Test actions
