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国外红外焦平面探测器组件可靠性研究综述 被引量:5

Reliability Research on Foreign Infrared Focal Plane Assembly
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摘要 介绍了国外焦平面探测器组件可靠性研究的主要特点和内容。焦平面探测器组件的主要制造商,建立了较完善的可靠性保证体系,可靠性研究融入设计与制造全过程,是基于过程的可靠性研究。在研制阶段进行失效模式的充分暴露与加速试验研究;批生产阶段进行工艺优化,并降低系统成本;建立数据库,进行可靠性评估方法研究。 This paper describes some reliability assurance practices for Infrared Focal Plane Array Detector Dewar Cooler Assembly (IDDCA) in foreign countries. Many IDDCA manufacturers have their own reliability assurance systems to obtain high reliability in the developing and manufacturing process. Their research includes exposing failure modes and accelerating tests in development phase, optimizing processes and life cycle cost during the manufacturing, and evaluating reliability of IDDCA relying on database.
作者 张莹 刘塑
机构地区 昆明物理研究所
出处 《红外技术》 CSCD 北大核心 2012年第3期134-139,共6页 Infrared Technology
基金 国防科技工业质量与可靠性专业技术基础科研计划项目
关键词 焦平面探测器组件 可靠性 加速试验 Infrared Focal Plane Array detector dewar cooler assembly, reliability, accelerating test
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参考文献23

  • 1GR-468-CORE.Generic Reliability Assurance Requirements for Optoelectronic Devices Used In Telecommunications Equipment,1998.
  • 2V.Loung,A.O Baid,and S.Harper.Path to Low Cost and HighReliability Stirling Coolers[J].Cryocoolers,1997,9:97-108.
  • 3Philippe Tribolet,Jean-Pierre Chatard.From research to production:10years of success[C]//proc.SPIE,2000,4130:422.
  • 4P Costa,P Tribolet.Recent results on Sofradir HgCdTe detectors.Instituteof Physics.NUMB,2006,187:405-412.
  • 5Xavier BRENIERE,Alain MANISSADJIAN.Reliability optimization forIR detectors with compact cryo-coolers[C]//SPIE ORLANDO.2005:5783-21.
  • 6Xavier BRENIERE,Philippe TRIBOLET.IR detectors design andapproach for tactical applications with high reliability withoutmaintenance[C]//SPIE,2008,6940:69400H.
  • 7陈循,陶俊勇,张春华.可靠性强化试验与加速寿命试验综述[J].国防科技大学学报,2002,24(4):29-32. 被引量:71
  • 8祝耀昌,王宇宏.高加速应力试验及其与传统试验的比较[J].装备环境工程,2006,3(4):16-19. 被引量:6
  • 9祝耀昌.可靠性试验及其发展综述[J].航天器环境工程,2007,24(5):261-269. 被引量:31
  • 10Per W.Schmidt.NRL Hybrid Reliability Physics Of Failure Initial Study.ADA217986.1990.

二级参考文献43

  • 1程依明.步进应力加速寿命试验的最优设计[J].应用概率统计,1994,10(1):52-61. 被引量:32
  • 2王玲玲,王炳兴.对数正态分布下序进应力加速寿命试验的统计分析[J].华东师范大学学报(自然科学版),1995(4):1-8. 被引量:8
  • 3葛广平 马海训.Weibull分布场合下步进应力加速寿命试验的统计分析[J].数理统计与应用概率,1992,7(2):150-159.
  • 4朱美娴.高加速寿命试验(HALT)与高加速应力筛选(HASS)[J].装备质量,2001,3:1-14.
  • 5Hobbs G K. HALT and HASS Seminar [C]. Detroit, MI, February 26, 1996. http://www.hobbsengr.com.
  • 6Robert H, Gusciora. The Use of HALT to Improve Computer Reliability for Point-of-Sale Equipment [C]. 1998 Proceeding Annual Reliability and Maintainability Symposium, 89-93.
  • 7David Rahe. The HASS Development Process [C]. 2000 Proceeding Annual Reliability and Maintainability Symposium, 389-394.
  • 8Silverman M. HASS Development Methods: Screen Development, change schedule, and re-prove schedule [C]. 2000 Proceeding Annual Reliability and Maintainability Symposium, 245-247.
  • 9Silverman M. Summary of HALT and HASS Results at an Accelerated Reliability Test Center [C]. 1998 Proceeding Annual Reliability and Maintainability Symposium, 30-36.
  • 10Robert W D. Reliability Enhancement Testing (RET) [C]. 1994 Proc. Annual Reliability and Maintainability Sym, 91-98.

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