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常用插值在计量中的应用 被引量:4

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摘要 一、引言通常情况下,检定规程、校准规范中所要求检定、校准的点不一定是企业实际应用中所需要利用的点。根据法定计量检定机构所出具的检定、校准证书中给出的检定、校准点的示值,我们可以通过插值方法合理计算得出企业实际应用中所需要点的示值。
作者 车磊
出处 《中国计量》 2012年第2期94-95,共2页 China Metrology
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  • 1严家明,刘诗斌,李辉.线性插值的误差计算方法研究[J].弹箭与制导学报,2005,25(4):111-112. 被引量:15
  • 2徐文秀.基于Excel的插值与拟合[J].水利与建筑工程学报,2007,5(1):86-89. 被引量:5
  • 3吕同富,康兆敏,方秀男.数值计算方法[M].清华大学出版社,2008:136—177.
  • 4Zhang Xiaowu, Chai T C, Lau J H, et al. Development of through silicon v/a (TSV) interposer technology for large die (21 mm : 21 mm) fine-pitch Cu/low-k FCBGA package. 59th Electronic Compo- nents and Technology Conference (ECTC), IEEE, 2009:305-312.
  • 5Lan J H. Overview and outlook of through-silicon via (TSV) and 3D integrations. Microelectronics International, 2011; 28(2): 8-22.
  • 6Xilinx and Amkor discuss 3D interposer programs. 2011-q)3-18, Available : http : //www. i-micronews, com/news/Xilinx-Amkor-dis- cuss-3 D-interposer-programs ,6624. html.
  • 7Lall P, Gupte S, Choudhary P, et al. Solder joint reliability in elec- tronics under shock and vibration using explicit finite-element subm- odeling. IEEE Transactions on Electronics Packaging Manufacturing, 2007; 30(1) : 74-83.
  • 8Wang G, Ho P S, Groothuis S. Chip-packaging interaction : a critical concern for Cu/low k packaging. Mieroelectronies Reliability, 2005 ; 45(7) : 1079-1093.
  • 9Ba Zahn. Solder joint fatigue life model methodology for 63Sn37Pb and 95.5Sn4Ag0.5Cu materials. 53rd Electronic Components and Technology Conference (ECTC), IEEE, 2003:83-94.
  • 10Selvanayagam C, Zhang X, Rajoo R, et al. Modeling stress in silieonwith TSVs and its effect on mobility. Components, Packaging and Manufacturing Technology, IEEE Transactions on, 2011 ; 1 ( 9 ) : 1328-1335.

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