摘要
厚膜铂电阻是80年代推出的新一代铂电阻测温元件。以铂浆料代替铂丝,用印刷工艺制成版图代替丝绕,用激光调值代替手工调值,用破璃浆料复层代替绝缘物封装。生产成本低,特性符合 IEC 标准,响应速度快,抗冲击、振动,可靠性高,用途广泛。本文综述这种测温元件的发展背景、结构特点、工艺、性能及应用前景。
This paper gives a review of thick-film PRTD's construction, production process,performance,application prospect and development in this country and abroad.They are a new generation PRTD manufactured in modern printing technology and have operational characteristics of faster thermal response,better resistance to vibration and shock,higher stabi- lity and reliability and lower cost.Thick-film PRTD offers replacement for conventional wire wound PRTD made to international specifications.
出处
《宇航计测技术》
CSCD
北大核心
1990年第4期35-42,共8页
Journal of Astronautic Metrology and Measurement
关键词
测温元件
厚膜铂电阻
温度测量
Temperature measurement
Thick-film Pt resistor
Resistance thermometer
Structural manufacturing process
Performance analysis
