摘要
在深入分析电化学腐蚀原理的基础上,发现了一种提高针尖的尖锐程度的新方法,即:利用下端腐蚀方法得到了比传统的上端腐蚀方法更尖锐的针尖.通过对腐蚀电压、腐蚀溶液浓度、切断时间的研究和分析,总结出下端腐蚀法制备纳米级STM探针的最佳综合条件;并通过对前人方案的修改和完善,研制了一套自动控制切断电路装置,该电路装置可以任意设置切断条件,以此得到不同粗细的针尖;最后将据此制作的纳米级针尖成功地应用于Unisoku-STM仪器的扫描,得到了清晰、稳定的原子级分辨Bi(0001)图像.
Scanning tunneling microscopy（STM） is a powerful instrument in surface analysis,which can obtain atomic resolution image in real space.Thus the quality of the STM tip is the key factor for achieving atomic resolution images.Based on the principle of electrochemical etching,a new method has been developed for fabricating high-quality STM tips with good reproducibility,which derive tips from the bottom of W wire,not from the upper part normally,and an auto-control device has been established based on the results from some references.So different sharpness tips were fabricated and the efficiency was greatly enhanced compared to the manual cutting method.At last,we used our tips into Unisoku-STM and obtained a clear,stable atomic resolution Bi（0001） image.
出处
《西南大学学报（自然科学版）》
CAS
CSCD
北大核心
2011年第5期39-44,共6页
Journal of Southwest University(Natural Science Edition)
基金
国家大学生创新实验基金资助项目(091063535)
关键词
扫描隧道显微镜
电化学腐蚀
液膜法
自动切断电路
STM探针制备
scanning tunneling microscopy（STM）
electrochemical etching
Lamella drop-off technique
circuit of automatically cutting off
preparation of STM tips
