摘要
本文用滤纸吸附标准溶液制作标样,用发射光谱法对ZnSe膜层中Zn、Se原子比进行了测定。考察了测定条件,方法相对标准偏差为7.5％。
In our experiments standard sample was made by filter paper absorbing the standard solution the proportion of Zn and Se in the thin film of ZnSe was measured by means of emission spectrum analysis The conditions of determination were discussed. The relative standard deviation of this method was 7.5%.
出处
《光学机械》
CSCD
1989年第2期54-55,共2页
基金
国家自然科学基金
