摘要
本文采用X射线衍射、差热分析、电子探针能谱等分析方法对彩色显象管封接用PbO-ZnO-B_2O_3系统低熔焊料玻璃的结晶性能进行了研究,探讨了其在封接过程中所发生的再结晶现象的实质以及玻璃颗粒度、晶核剂用量等因素对结晶过程的影响,揭示了晶体生长速度随温度的变化关系,并求得了其晶体生长的活化能。
X-ray powder diffraction,differential thermal analysis(DTA)and electron probe X-ray microanalyzer are used to study the crystallization behavior of devitrifiable solder glass in the system PbO-ZnO-B_2O_3,which is used in colour picture tube (CPT)sealing.Re-crystallization in the sealing process of this solder glass at 440℃ and influence of glass particle size and amounts of micleating agent on crystallization are studied.The relationship between the crystal growth rate and the temperature is determined,and the crystal growth activation energy is also obtained by DTA.
出处
《西北轻工业学院学报》
1990年第4期88-94,121,共7页
Journal of Northwest University of Light Industry
