摘要
本文研究了实验室EXAFS测量中,应用单色器晶体二级衍射的有关问题,当测定的能量范围内,X射线连续谱上存在杂质发射线时,将导致测定吸收谱精细结构的畸变,研究了对这种谱线畸变进行修正的方法,并对采用晶面二级衍射测定时,EXAFS谱振幅降低的情况下如何求得正确的结构参数进行了讨论。
Some aspects on the application of second order diffraction of a monochrometer in laboratory EXAFS measurement are studied. Significant distortions in measured X-ray absorption fine structure occur when there are impurities' emission lines on the continuum spectra m the investigated energy range. A method for correcting that distortion is proposed. As the EXAFS amplitude decreases, which is caused by the application of second order diffraction of a monochrometer, how to obtain correct structural parameters is also discussed.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
1990年第10期1684-1690,共7页
Acta Physica Sinica
基金
国家自然科学基金资助的课题
