摘要
本文利用 X 射线衍射法对 PLZT 8/65/35在直流偏压下升温及降温时的转变特征作了详细的研究。在-2℃(T_f)及72℃(T_d)处观察到了衍射峰位置的偏移,并利用微畴—宏畴转变模型对实验现象做了解释。由晶体的结构变化特征证实了 T_f 处为微畴转变为宏畴的过程,T_d 处为宏畴的瓦解过程。
A detailed study of transition behavior of 8/65/35 PLZT ceramics during hea-ting and coolig under DC bias was carried out by X-ray diffraction.A shift of dif-fraction peak of freshly depoled sample was detected at about -2℃(T_f) and 72℃(T_d) during heating under 3kV/cm DC bias.Micro-macro domain transition wasused to explain the phenomena taking place at T_f and T_d·The structure changeobserved by X-ray diffraction conformed that the microdomains converted into ma-crodomains at T_f and macrodomains collapsed at T_d during heating under DC bias.
出处
《无机材料学报》
SCIE
EI
CAS
CSCD
北大核心
1990年第1期84-89,共6页
Journal of Inorganic Materials
关键词
弛豫型
铁电体
PLZT
陶瓷
畴
Ferroelectrics
PLZT
X-ray diffraction
Domain
