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TiO_2薄膜厚度及其光学常数的测量 被引量:4

Determination of the Thickness and Optical Constants of TiO_2 Film
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摘要 描述了非线性回归模型在 Ti O2 薄膜的光学常数及其厚度测量中的应用.利用薄膜在可见光范围内的光谱特性使用曲线拟合技术对它的光学常数进行了测量.研究结果表明,这种方法可以简单、高效地应用于对薄膜厚度及其光学常数的测量. In this paper, a nonlinear regression model is utilized to measure the optical constants of TiO 2 thin film. We measured the optical constants by fitting the visible transmission spectra. The results suggest that this method can be applied to estimate optical constants, such as dispersion refractive index, thickness and absorption coefficient effectively for its versatility.
出处 《东南大学学报(自然科学版)》 EI CAS CSCD 1999年第5期105-108,共4页 Journal of Southeast University:Natural Science Edition
关键词 非线性 回归模型 薄膜 光学常数 二氧化钛 测量 nonlinear regression model thin film optical constant
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参考文献2

  • 1Lin Y,Science,1997年,278卷,31期,840页
  • 2Chiao C,Appl Opt,1995年,34卷,31期,7355页

同被引文献38

  • 1潘永强,朱昌,弥谦,宋俊杰.电子束蒸发TiO_2薄膜的光学特性[J].应用光学,2004,25(5):53-55. 被引量:11
  • 2张德恺,胡晓云,李婷,黄亚娜,马一平,李莉莎.TiO_2纳米薄膜微观结构及光学性能研究[J].光子学报,2004,33(8):982-985. 被引量:19
  • 3王凯旋,王小勇,汪传宝,赵璧英,谢有畅,唐有祺.凝胶纳米氧化钛的Raman光谱研究[J].物理化学学报,1995,11(1):5-8. 被引量:8
  • 4邹炳锁,林金谷,汪力,徐积仁,赵家龙.表面包覆TiO_2纳米微粒的结构表征、电子态与性质[J].物理学报,1996,45(7):1239-1243. 被引量:10
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  • 8Chow L L W. Reactive Sputtered TiO2 Thin Film Humidity Sensor with Negative Substrate Bias[J]. Sensors and Actuators, 2001,176: 310.
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