摘要
本文介绍了在H-800透射电镜上获取高分辨矿物晶格象和薄箔样本能谱定量分析的开发工作。用环氧树脂包埋方法和离子减薄技术,对非导体的地质样品可以制成很好的超薄样本,从而可以方便地在透射电镜上观察样品的内部超微结构和高分辨的矿物晶格象。为了采用“比例法”进行薄箔样本的x-光能谱定量分析,先用已知化学组成的矿物薄箔标样,对配在透射电镜上的能谱分析系统进行校正,求出各元素的k-系数。最后将上述方法用于对我国不同海区绿色自生矿物颗粒的研究。
This paper presents the exploration work of obtaining high-resolution lattice image of minerals and quantitative analysis of thin foils using Energy Dispersive X-ray Spectrometry (EDX) on H-800 TEM/AEM. Good thin specimens were prepared using epoxy resin impregnation and ion-thinning technique, so that the ultramicrostructure could be observed and lattice image of mineral crystals could be easily obtained, k-values, which are necessary for EDX quantitative analysis of thin foils using 'ratio technique', have been determined from thin mineral standard for which the elemental contents were accurately known. Finally. the above introduced technique, namely, analytical electron microscopy was applied to the study of green authigenic grains from various areas of the China Sea.
出处
《同济大学学报（自然科学版）》
EI
CAS
CSCD
1990年第4期487-493,共7页
Journal of Tongji University:Natural Science
关键词
高分辨
透射
电镜
矿物
High-resolution electron microscopy
Energy dispersive
Clay minerals
