摘要
本文通过常温和高温正负电晕注极、低能电子束轰击和热释电(TSD),对聚三氟氯乙烯(Polychlorotrifluorothylene,PCTFE)的驻极体性能进行了讨论。确定了电晕注极后的样品在150℃高温下老化时平均电荷重心的迁移规律。利用初始上升法和峰值清洗术,估算了不同能阱的活化能及相应能阱的尝试逃逸频率。借助于激光感应压力脉冲(Laser Induced Pressure Pulse, LIPP)法,还讨论了脱阱载流子在PCTFE体内的输运模式,并利用电子束注极组合热脉冲技术,研究了不同能阱的载流子沿样品厚度方向的几何分布。
In this paper, the electret behaviors of negative and positive charging at RT and elevated temperatures in polychlorotrifluorothylene (Aclar PCTFE) has been studied by means of corona discharging, electron-beam discharging and thermally-stimulated discharge (TSD). The shift of mean charge depth with the different time during ageing at 150℃ after corona charging has been investigated. Activation energies are obtained from the initial rise of the TSD peak and peak cleaning technique. From the obtained results of activation energies, the attempt-to-escape frequencies have been estimated. The transport model of detrapping charge in a sample for Aclar PCTFE has been discussed also by means of Laser Induced Pressure Pulse (LIPP) method. Geometric distributions of traps with different activation energies along thickness of Aclar PCTFE sample have been studied by means of electron beam bombardment in combination with heat pulse method. At the same time, comparison of the charge storage capability between positive and negative corona charged samples has been carried out. Some physical properties of Aclar PCTFE compared with that of Teflon FEP have been discussed.
出处
《同济大学学报（自然科学版）》
EI
CAS
CSCD
1990年第3期355-362,共8页
Journal of Tongji University:Natural Science
关键词
聚三氟乙烯
驻极体
稳定性
电荷
Polychlorotrifluorothylene
Electret
Stability
