摘要
针对静态傅里叶变换光谱仪中干涉条纹采集与处理对速度快的特殊要求,设计了用现场可编程门阵列(FPGA)实现干涉图采集和频谱复原系统,CCD采集干涉条纹后进入FPGA进行切趾、傅里叶变换、取模等处理后得到入射光的频谱信息,同时对干涉图切趾函数的选取进行探讨和比较。最后,分别采集中心波长635 nm、650 nm7、80 nm、808 nm8、50 nm半导体激光器通过楔形干涉具的干涉条纹,并将FPGA中频谱复原结果与Avan-tes公司的光纤光谱仪测得结果进行比较,误差在2.5%以内。
In order to meet the special requirements of fast speed of interference fringes acquisition and processing in static Fourier transform spectrometer,the interference fringes collection and spectrum recovery system using FPGA was designed in this paper.After interference fringes collection by CCD and apodization,Fourier transform,modeling by FPGA,the spectrum of interference fringes were obtained.At the same time,the selection of apodization functions were compared and discussed.Finally,the interference fringes of center wavelength of 635 nm,650 nm,780 nm,808 nm,850 nm semiconductor laser through the wedge-shaped interference were collected respectively and processed in FPGA.Comparing the FPGA spectrum recovery results with measured results by fiber-optic spectrometer of Avantes,the inaccuracy was within 2.5%.
出处
《压电与声光》
CSCD
北大核心
2011年第2期192-195,共4页
Piezoelectrics & Acoustooptics
基金
科技部国际合作基金资助项目(2010DFR10520)
山西省国际合作计划基金资助项目(2010081038)
山西省科技攻关基金资助项目(20090321044)
山西省科技平台建设基金资助项目(2010091013)
