摘要
第一行过渡金属元素及痕量贵金属元素高度富集在硫化物矿物中,常形成具有工业意义的矿床,使得硫化物具有重大的经济价值。对天然硫化物矿物中的这些痕量金属元素丰度及其分布的研究,在矿石成因学、经济地质学、环境地球化学等领域具有重要的应用价值。激光剥蚀-电感耦合等离子体质谱(LA-ICP-MS)微区分析技术是一种强大的痕量元素分析工具,非常适合直接分析硫化物矿物中痕量元素的浓度及其空间分布。由于硫化物的激光剥蚀特性与硅酸盐及氧化物不同,分析校准用的标准物质又极度缺乏,严重阻碍了这一技术在硫化物矿物微区分析中的应用。本文评述了硫化物简介、硫化物中痕量金属元素分析的意义、LA-ICP-MS微区分析技术在硫化物矿物痕量元素分析中的优势及近年来的应用进展、硫化物分析中的干扰与校准、包含铂族元素及金的硫化物标准物质的研制进展及合成硫化物标准物质最有应用前景的方法。
The first-row transition metals and trace noble metals are highly enriched in sulfide minerals.Commonly,sulfides are the main ore types forming large ore deposits of industrial significance,which makes sulfide minerals of great economic value.Measurement of trace metal element abundances and spatial distributions in natural sulfide minerals are highly important in the study of ore genesis,economic geology and environment geochemistry.LA-ICP-MS is a powerful tool for microanalysis of trace elements and is suitable to directly analyze trace element abundances and spatial distributions in sulfide minerals.However,development of analysis of trace metal elements in sulfide minerals by LA-ICP-MS has been hampered by different ablation characteristics of sulfides from silicates and oxides and a serious lack of reference materials of sulfides.This paper summarizes some geological background of sulfide minerals,the analysis significance of trace metals in sulfides,the advantages and recent applications of LA-ICP-MS in quantitative analysis of major and trace elements in sulfide minerals,related argide and oxide interferences and the development of four methods of synthetic sulfide reference materials for trace elements including PGEs and Au.By comparing the four synthetic methods,it was found that the method of sintering at high temperature or high pressure is the most promising method for synthetic sulfide reference materials at present.
出处
《岩矿测试》
CAS
CSCD
北大核心
2011年第2期121-130,共10页
Rock and Mineral Analysis
基金
科技部创新方法工作专项资助(2009IM032200)
关键词
硫化物矿物
激光剥蚀-电感耦合等离子体质谱法
微区分析
痕量元素
标准物质
sulfide mineral
laser ablation-inductively coupled plasma mass spectrometry
microanalysis
trace elements
reference materials
