摘要
固体继电器工作在复杂电磁环境中时,外界辐射干扰通过继电器线缆和屏蔽壳上的孔缝进入装置内部,从而对内部敏感电路产生影响,严重时会引起继电器的失效。以某型号直流固体继电器为研究对象,采用电磁拓扑理论分析了平面电磁波通过继电器引线进入内部的线缆耦合和通过屏蔽壳孔缝进入内部的孔缝耦合,将辐射干扰转化为作用于内部电路的等效干扰源,通过求解BLT方程获得内部引脚端部的响应。采用全波有限元仿真软件Ansoft HFSS建立固体继电器的三维有限元模型,仿真结果与电磁拓扑方法的计算结果吻合良好。进一步分析了外接引线长度和屏蔽壳孔缝尺寸对固体继电器辐射敏感性能的影响。所提的固体继电器辐射敏感性分析方法可为继电器的电磁兼容性能分析与预测提供参考。
The outer radiated interference,which enters the interior of the solid state relay（SSR） through leads and apertures,can affect the inner sensitive circuit,and even make the SSR invalid under the complex electromagnetic environment.In this paper,a certain type of DC SSR working in the atrocious electromagnetic condition was analyzed based on the electromagnetic topology and the finite element method.The influence of radiated emission coupling through signal leads at the input/output port and apertures on the shield shell was transformed into an equivalent interference source inside of the shell;and the response at the inner port can be obtained by solving the BLT equation.The finite element model of the DC SSR was established by the software of Ansoft HFSS;and its radiated sensitivity was analyzed by calculating induced voltage and current at the input port.The simulation results agree well with the calculation results through the electromagnetic topology method.Furthermore,it was analyzed that different lengths of signal leads at the input/output port and radiuses of apertures on the shield shell can influence the radiated sensitivity of SSR.The analytical method introduced is significant for the analysis and the forecast of the EMC capability of SSR.
出处
《中国电机工程学报》
EI
CSCD
北大核心
2011年第9期113-119,共7页
Proceedings of the CSEE
关键词
固体继电器
辐射敏感性
电磁拓扑
BLT方程
有限元方法
solid state relay（SSR）
radiated sensitivity
electromagnetic topology
BLT equation
finite element method
