摘要
将旋涂制备的薄膜在120oC下退火,得到α相的聚辛基芴薄膜,用吸收光谱和荧光光谱进行了验证。用同步辐射一维和二维掠入射X射线衍射对薄膜进行了结构表征,结果表明,虽然聚辛基芴系非线型分子,但在薄膜微晶中分子链段主要以平行于基底的edge-on模式排列。
Thin films of α phase polyoctylfluorene were prepared by thermal annealing spin-coating at 120℃, which is confirmed by absorption and photoluminescence spectra. The microstructure was characterized by using one-dimensional and two-dimensional grazing incident X-ray diffraction. The results show that molecular chain of the PFO is mainly parallel to the substrate with edge-on oriemation.
出处
《核技术》
CAS
CSCD
北大核心
2011年第2期139-142,共4页
Nuclear Techniques
基金
国家自然科学基金(50803065
20990233)资助
关键词
掠入射X射线衍射
聚辛基芴薄膜
微结构
Grazing incident X-ray diffraction, Polyoctylfluorene thin film, Microstructure
