摘要
The X-ray spectra induced by the highly charged xenon and argon ions impinging on a tantalum surface are reported. The experiment was done at the ECR ion source of H1RFL. It is found that the yield of the tantalum M-X rays increases intensively as the projectile kinetic energy increasing. Moreover, the tantalum M-X ray induced by the xenon ions is higher in energy and broader in width than that induced by the argon ions (as shown in Figs. 1 and 2).
The X-ray spectra induced by the highly charged xenon and argon ions impinging on a tantalum surface are reported. The experiment was done at the ECR ion source of H1RFL. It is found that the yield of the tantalum M-X rays increases intensively as the projectile kinetic energy increasing. Moreover, the tantalum M-X ray induced by the xenon ions is higher in energy and broader in width than that induced by the argon ions （as shown in Figs. 1 and 2）.
