摘要
采用溶胶-凝胶法在单晶硅上制备了钴铁氧体薄膜。在不同温度下对样品进行了退火处理,通过X射线衍射仪(XRD)、扫描电子显微镜(SEM)、透射电子显微镜(TEM)和振动样品磁强计(VSM)等分析了样品的物相组成、晶粒大小、表面形貌、样品厚度及不同温度下的磁性能。结果表明:制备出的CoFe2O4薄膜为尖晶石结构,表面比较致密,平均晶粒尺寸20～50 nm。在173～400 K范围内,随着温度的升高,钴铁氧体薄膜的矫顽磁场逐步减小,而磁矩是先增加后减少,并对产生的原因进行了分析。
Cobalt ferrite thin films were prepared on monocrystalline silicon by sol-gel method.The specimens were annealed at different temperature.The phase composition,crystal size,surface morphology,thickness and magnetic properties were analyzed by X-ray diffractometer（XRD）,Scanning Electron Microscope（SEM）,Transmission Electron Microscope（TME）,and Vibrating Sample Magnetometer（VSM）.The results show that the crystal structure of CoFe2 O4 films is Spinel,and their surface is dense.The mean size is in the range of 20 ～ 50 nm.The coercivity of CoFe2 O4 films gradually decreases with temperature rising,but magnetic moment first increases then decreases in the temperature range of 173 ～ 400 K.The reasons for the phenomenon were analyzed.
出处
《电子显微学报》
CAS
CSCD
北大核心
2010年第5期420-424,共5页
Journal of Chinese Electron Microscopy Society
