摘要
用库仑分析法测定了在湿热含Ｈ２Ｓ气氛中铜表面腐蚀膜层的厚度及其随腐蚀时间的变化，对不同Ｈ２Ｓ浓度的膜层变化曲线存在的差异进行了探讨。俄歇能谱分析表明库仑分析法测定铜的硫化腐蚀膜厚度是可靠的。分析了膜层厚度变化对电接触性能的影响及其异常现象。
The thickness of corrosion films on copper electric contact surface,which formed in moisture heat atmosphere including H 2S gas,is determined by coulometry.The thickness changes along with corrosion time are protracted.The difference of film variety curve in two H 2S densities is researched.The AES analysis shows that coulometry was used correctly in our experiment condition.The effect of film thickness variety on electric contact property as wel as its special phenomena is analyzed.
出处
《电子工艺技术》
1999年第3期120-122,共3页
Electronics Process Technology
