摘要
Te是发展高科技产业不可缺少的半导体材料之一,被广泛应用于冶金、石油化工、电子电气、玻璃陶瓷和医药等行业。同时,Te又是一种潜在的环境污染元素。Te在地壳中含量低而分散,寻找高灵敏度的地质样品中Te的检测分析方法一直是人们关注的问题。重铬酸钾容量法、碘量法、极谱法、分光光度法等常见测Te方法灵敏度不够理想,操作步骤也较繁琐。评述了1995—2009年地质样品中Te的检测方法概况及其发展趋势,重点对样品的前处理方法、氢化物发生/原子荧光法和电感耦合等离子体质谱法的优缺点进行了阐述和讨论,指出利用高能效的分离技术达到各形态的有效分离和利用选择性强、灵敏度高的元素特征检测器来达到超痕量形态的测定仍将是地质样品中Te分析的研究趋势。
Tellurium was an important semi-conductor material of high-tech industry.It has been widely applied in the metallurgy industry,petrochemical industry,electrical engineer industry,glass ceramics industry and medical industry.Tellurium as a latent environmental pollutant element has been detected in the earth’s crust,so the determination of tellurium in the geological samples caused the people’s high concern.A review of recent research advancement in tellurium determination methods was presented,including pretreatment method,hydride generation-atomic fluorescence spectrometry method and inductively coupled plasma-mass spectrometry method The current status,process improvements,advantages and disadvantages of these methods were analyzed and compared.The results indicated that the effective tellurium speciation technology and the high selectivity and sensitivity detector will be the research trend for tellurium determination.
出处
《环境污染与防治》
CAS
CSCD
北大核心
2010年第9期68-72,共5页
Environmental Pollution & Control
基金
浙江省环保科技计划项目(No.200923)
关键词
TE
样品前处理
氢化物发生
原子荧光
电感耦合等离子体质谱
干扰
地质样品
tellurium
the pretreatment method
hydride generation
atomic fluorescence spectrometry
inductively coupled plasma-mass spectrometry
interference
geological samples
