期刊文献+

1:1映射情况下电阻阵列Flood法非均匀性校正技术研究 被引量:3

Flood Nonuniformity Correction for Resistor Array Infrared Projectors at 1:1 Mapping Condition
在线阅读 下载PDF
导出
摘要 电阻阵列非均匀性校正技术一直都是国外相关科研机构的研究热点,目前主要的非均匀性校正技术有两种——稀疏网格法和flood法。与稀疏网格法相比,flood法的算法比较复杂,需要亚像素的相关知识,并且要充分考虑图像退化、映射比和配准精度对校正流程的影响,但是不需要处理大量的网格图像数据,因此校正耗时较短,而且更适用于低驱动电压的情况。在红外热像仪与电阻阵列1:1映射的情况下对电阻阵列flood法非均匀性校正技术进行了研究,提出了校正算法,阐述了电阻阵列投射的红外图像发生退化的过程,并对图像退化对校正算法的影响进行了研究。研究发现,图像退化将导致"边缘效应",有可能引起误校正,而且退化函数的尺度将影响校正算法的收敛速度。 As one of the most important factors influencing the performance of dynamic infrared scene generation system, the fidelity of the scenes that are being projected draws foreign R&D attention. According to the foreign research papers, both the sparse grid and flood nonuniformity correction (NUC) techniques have been used successfully for correcting infrared projector fixed pattern noise. It is clear that each of them has advantages and drawbacks. In our earlier paper, the sparse grid technique was studied, and a refined method was developed according to the existing laboratory condition. Compared with the sparse grid technique, the flood technique needs complicated algorithms and sub-pixel knowledge. Besides, it needs to take the influences of image degeneration, mapping ratio and registration precision into count. But the flood technique is more accurate in the low radiance domain and the procedure takes shorter time, since it doesn't need to process large amount of grid image data. The flood nonuniformity correction algorithm is studied at the unity and non-unity mapping ratio condition, the NUC algorithm is introduced, the course of image degeneration of projected infrared image and the influences of image degeneration on the flood algorithm are studied in particular. According to the simulation result, edge effect appeared caused by image degeneration, and the width of point spread function influenced the convergence rate of the flood nonuniformity correction algorithm.
机构地区 中国人民解放军
出处 《红外技术》 CSCD 北大核心 2010年第9期535-540,共6页 Infrared Technology
基金 某院重点平台建设项目 编号:WX07233
关键词 电阻阵列 非均匀性校正 flood法 图像退化 resistor array, nonuniformity correction(NUC), flood, image degeneration
  • 相关文献

参考文献10

  • 1黄士科,张天序,李丽娟,陈宝国.空空导弹多光谱红外成像制导技术研究[J].红外与激光工程,2006,35(1):16-20. 被引量:32
  • 2张凯,黄勇,孙力,阎杰.MOS电阻阵的非均匀性测量及补偿方法研究[J].西北工业大学学报,2007,25(1):108-112. 被引量:11
  • 3朱岩,王仕成,苏德伦,张金生,廖守亿.MOS电阻阵列非均匀性校正技术研究[J].红外技术,2009,31(3):148-151. 被引量:6
  • 4Owen M. Williams. Search for optimal infrared projector nonuniformity correction procedures[C]//Proceedings ofSPIE, 1999, 3697: 352-365.
  • 5Leszek Swierkowski, Owen M. Williams. Search for optimal infrared projector nonuniformity correction procedures II[C]//Proceedings of SPIE 2000, 4027: 214-225.
  • 6姚敏.数字图像处理[M].北京:机械工业出版社,2007.
  • 7Henri Maitre.现代数字图像处理[M].北京:电子工业出版社,2007.
  • 8Robert A. Joyce, Leszek Swierkowski, Owen M. Williams. Resistor array infrared projector nonuniformity correction-search for performance improvement[C]//Proceedings of SPIE, 2006, 62081A: 11.
  • 9Robert A. Joyce, Leszek Swierkowski, Owen M. infrared projector nonuniformity correction: improvement llI[ C]//Proceedings of SPIE, 2008, Williams. Resistor array search for performance 69420N: 12.
  • 10Owen M. Williams. Dynamic infrared scene projection: the scene filtering and sampling problem revisited[C]//Proceedings of SPIE, 1998, 3368:98-115.

二级参考文献23

  • 1范伟,王毅,饶瑞中.根据大气辐射特征进行目标探测的波段选择[J].红外与激光工程,2005,34(2):177-182. 被引量:33
  • 2肖云鹏,马斌,梁平治.国产电阻阵列动态红外景像投射器研制进展[J].红外技术,2006,28(5):266-270. 被引量:22
  • 3吴永刚,崔彬,吴根水,吕俊杰.基于MOS—电阻阵列的红外动态图像生成系统[J].测控技术,1996,15(5):55-57. 被引量:10
  • 4张凯,黄勇,孙力,阎杰.MOS电阻阵的非均匀性测量及补偿方法研究[J].西北工业大学学报,2007,25(1):108-112. 被引量:11
  • 5小哈德逊RD.红外系统原理[M].北京:国防工业出版社,1975.27-80.
  • 6Alexander G. Hayes, Fino J. Caraco, David C. Harrison, John M. Sorvari Characterization and Comparison of 128×128 element Nuclear Optical Dynamic Display System Resistive Arrays[C]//Proceedings of SPIE, 2006, 6208: 62080X-1-18.
  • 7Leszek Swierkowski, Owen M. Williams. Advanced flood nonuniformity correction for emitter array infrared projectors[C]//Proceedings of SPIE, 2002, 4717: 108-119.
  • 8Breck Sieglinger, James Norman, William M. Meshell, David S. Flynn. Array nonuniformity correction-new procedures designed for difficult measurement conditions[C]//Proceedings of SPIE, 2003, 5092: 210-220.
  • 9Robert A. Joyce, Leszek Swierkowski, Owen M. Williams. Resistor array infrared projector nonuniformity correction_ search for performance improvement[C]//Proceeding of SPIE, 2006, 6208: 62081A-1-62081A- 11.
  • 10Leszek Swierkowski, Robert A. Joyce, Owen M. Williams. Resistor array infrared projector nonuniformity correction_ search for performance improvement Ⅱ [C]//Proceeding of SPIE, 2007, 6544: 654403-1- 654403-12.

共引文献53

同被引文献11

引证文献3

二级引证文献3

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部