摘要
文中用数学分析方法描述迈克尔逊干涉仪的平面镜Ｍ１与Ｍ２成任意角度时等倾干涉花样的变化特征，探讨了引起干涉条纹位置和条纹间隔变化的一般规律，并对其变化产生的原因进行了分析．
The pattern features of Michelson interferometer's equal inclination interference by anbitrary parallel position of mirror M 1 and M 2 are described by mathematical method in the paper. The regularity in change of the fringe position and fringe width is probed in terms of both theory and practice. The paper also analyse the main reason for the fringe position and fringe width which varies as incidence angle of light source and the position of mirror M 1 and M 2 and interference grade.
出处
《华南理工大学学报（自然科学版）》
EI
CAS
CSCD
北大核心
1999年第6期98-103,共6页
Journal of South China University of Technology(Natural Science Edition)
