摘要
介绍了一种光电二极管暗电流温度特性的测量系统，该系统采用了热电致冷器件和高精度的微电流计，非常适合测量一些小型光电器件的温度特性．还对测量数据进行了分析。
A kind of system measuring dark current temperature dependence of photodiodes is
introduced. This system made by Peltier and highly precise microammeter is very useful to
measure the temperature dependence of some small-size photoelectricity devices.The results
from which are helpful to design of photoelectricity measurement system.
出处
《南京师大学报（自然科学版）》
CAS
CSCD
1999年第2期40-43,共4页
Journal of Nanjing Normal University(Natural Science Edition)
