摘要
本文讨论了各种衍射式激光测粒仪在理论上的局限性,并设法加以改进和提高,从而发展了综合利用夫琅和弗衍射和米氏散射理论的激光测粒仪(FAM激光测粒仪),经对比性实测表明,其性能较国外的衍射式测粒仪有了明显的提高。
Owing to the broad measur able particle size range, wide applicability, reliable measurement and good reproducibility, Fraunhofer Diffraction based laser particle sizers have recently found growing uses in different industrial areas. Nevertheless, the accuracy of measurements made in small particle size range is not sufficient. In this paper the theoretical limitations of different Fraunhofer Diffraction based particle sizers are discussed and a combined Fraunhofer Diffraction and Mie Scattering(FAM)based laser particle sizer is developed, Comparative measurements show that the performances of FAM are much better than those of the Fraunhofer Diffraction based particle sizers.
关键词
激光测粒仪
测粒
激光技术
应用
Particle sizing
Laser particle sizer
Light scattering
Diffraction
