摘要
给出了实践４号（ＳＪ－４）星载ＩＤＴ７１２５６Ｄ高速ＣＭＯＳ静态存储器和ＨＭ８８３２异步静态存储器单粒子事件（ＳＥＵ）的总翻转率，器件类型翻转率，逻辑状态翻转率，并与国外某些卫星的监测结果进行了比较。另外对部分ＳＥＵ数据进行了统计分析，给出了ＳＥＵ的片上地址和到达时间差的分布规律及拟合曲线。
In this paper,using Single Event Upset (SEU) data collected by high speed static RAM IDT71256D and asynchronous static RAM HM8832 of SEU Monitor on board SJ 4 spacecraft,the total upset rate,the device type and the logic upset rates are obtained and compared with other space experiment results.In addition,the SEU distribution histograms and fit exponential decay curves for the differences of SEU address on chip and arrive time are given by statistic analysis based on portion of SEU data,and finally the conclusions are given.
出处
《中国空间科学技术》
EI
CSCD
北大核心
1999年第1期56-62,共7页
Chinese Space Science and Technology
基金
国家自然科学基金
