摘要
采用单光束Z扫描技术测量了GaAs－SiO2复合薄膜的光吸收和光折射特性，结果表明：在104W／cm2的辐射光强作用下，复合薄膜的光吸收和光折射表现出明显的非线性特征．根据Z扫描测量理论算得三阶非线性折射率系数和非线性光吸收系数分别为10-6cm2／W；和10-1cm／W量级．运用量子点模型对三阶光学非线性响应增强的机制进行了讨论．
Optical absorptive and refractive indexes of nanocrystalline GaAs-inlaid SiO2film were measured by single-beam Z-scanning technigue. Under the action of radioactive light in the order of 104W/cm2, obvious optical nonlinearity was observed in the optical absorptive and refractive indexes of the composite film. In accordance with the measurement theory of Z-scanning, the third-order nonlinear refraction rate coefficient and nonlinear absorption coefficient were calculated at the order of 10-6cm2/W and 10-1cm/W respectively. The mechanism for the response enhancement of the third-order optical nonlinearity was discussed by applying the quantum dot model.
出处
《汕头大学学报（自然科学版）》
1998年第1期8-12,共5页
Journal of Shantou University：Natural Science Edition
基金
广东省自然科学基金
关键词
复合薄膜
非线性光学特性
砷化镓
二氧化硅
GaAs
SiO_2
nanocrystalline composite film
nonlinear optical characteristic
