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一种低成本高精度CMOS基准电压源设计 被引量:3

Design of a High Accuracy CMOS Voltage Reference with Low Cost
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摘要 利用电子迁移率和MOS管阈值电压对温度的变化呈反向趋势的原理,基于0.13μm标准CMOS工艺,设计实现了一款非带隙的基准源电路.Hspice仿真显示该基准能提供0.715V基准输出,并可以根据需要在0.4V~1V范围内进行调节.在-25℃~125℃范围内,温度系数为21.6ppm,在25℃时输出基准线性度为0.237%. In this paper a non-bandgap voltage reference was designed in a standard 0.13μm CMOS technology,based on element that electron mobility and threshold voltage have opposite temperature coefficients. The simulation results using by Hspice show that the output of proposed voltage reference is 0.715V and it can be adjusted from 0.4V to 1V. Within the temperature range from -25 ℃ to 125 ℃,a temperature coefficient of 21.6 ppm/ ℃ is achieved,and the line regulation at 25 ℃ is 0.237%/V.
出处 《微电子学与计算机》 CSCD 北大核心 2010年第5期121-124,共4页 Microelectronics & Computer
基金 国家自然科学基金项目(60873016) 国家"八六三"计划项目(2008AA01Z149)
关键词 CMOS基准电压源 阈值电压 电子迁移率 CMOS voltage reference threshold voltage electron mobility
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参考文献6

  • 1谢毅,朱云涛,邵丙铣.一种低电压的CMOS带隙基准源[J].微电子学与计算机,2005,22(5):110-113. 被引量:12
  • 2张科,冯全源.一种带软启动电路的带隙基准电压源的实现[J].微电子学与计算机,2006,23(12):179-181. 被引量:7
  • 3Najafizadeh L, Filanovsky I M. Toward a Sub- 1 V CMOS coltage reference[J ]. IEEE Transactions on Circuit s and system, 2004 : 127 - 130.
  • 4Huang Po- Hsuan, Lin Hongchin, Lin Yen- Tai. A simple subthreshold CMOS voltage reference circuit with channel- length modulation compensation[J ]. IEEE Transactions On Circuit s And System, 2006,53(9) :882 - 885.
  • 5Ka Nang Leung, Philip K T Mok. A CMOS voltage reference based on weighted-VGS for CMOS low- dropout linear regulators[J ]. IEEE J Solid- State Circuits, 2003,38 (1):151 - 154.
  • 6Filanovsky I M, Allam A. Mutual compensation of mobility andthreshold voltage temperature effects with application in CMOS circuits[J]. IEEE J. Solid - State Circuits,2001 (48) :876 - 884.

二级参考文献12

  • 1江金光,王耀南.高精度带隙基准电压源的实现[J].Journal of Semiconductors,2004,25(7):852-857. 被引量:28
  • 2K E Kuijk. A precision reference voltage Source. IEEE J.Solid-state Circuits, 1973, 8: 222~226.
  • 3Banba H, Shiga H, Umezawa A, Miyaba T, Tanzawa T, Atsumi S, Sakui K. A CMOS bandgap reference circuit with sub-1-V operation. IEEE Solid-State Circuits, 1999,34: 5.
  • 4Malcovati P, Maloberti F, Fiocchi C, Pruzzi M. Curvature compensated BiCMOS bandgap with 1-V supply voltage.IEEE Solid-State Circuits, Volume. 2001, 36: 7.
  • 5Annema A-J. Low power bandgap references featuring DTMOSTs. IEEE Solid-State Circuits Volume: 1999, 34: 7.
  • 6M S J Steyart, W M C Sansen. Power supply rejection ratio in operational transactance amplifiers. IEEE trans. Circuits and Systems Ⅰ Volume. 1990, 37: 1077~1084.
  • 7Gianluca Giustolisi, Gaetano Palumbo. A detailed analysis of power-supply noise attenuation in bandgap voltage references. IEEE Trans. Circuits and Systems Ⅰ Volume.2003, 50(2).
  • 8Yannis P Tsividis. Accurate analysis of temperature effects in Ic_VBE characteristics with application to bandgap reference sources. IEEE Solid-State Circuits Volume. 1980,15, (6).
  • 9Andrea Boni. OP-Amps. and Startup Circuits for CMOS Bandgap ReferencesWith Near 1-V Supply. IEEE J. Solid-State Circuits, 2002, 37(10).
  • 10Behzad Razavi.Design of analog CMOS integrated circuits New York:McGraw-Hill,2001

共引文献17

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  • 1张科,冯全源.一种带软启动电路的带隙基准电压源的实现[J].微电子学与计算机,2006,23(12):179-181. 被引量:7
  • 2Abbas El Gamal. CMOS Image Sensors [J]. IEEE Circuits&Devices Magazine, 2005.
  • 3吕丽峰.TFT-LCD驱动芯片内置电荷泵研究与设计[D].西安:西北工业大学,2008.
  • 4Henson W K, Yang N, Kubicek S, et al. Analysis of leakage currents and impact on off-state power con- sumption for CMOS technology in the 100-nm regime [J]. IEEE Trans on Electron Devices, 2000, 45 (7): 1393-1400.
  • 5Keunwoo K, Hanafi H I, Cai J, et al. Off-state cur- rent and performance analysis for double-gate CMOS with non-self-aligned back gate [J]. IEEE Trans on Electron Devices, 2005, 52(9): 2104-2107.
  • 6Keunwoo K, Das K K, Joshi R V, et al. Leakage power analysis of 25-nm double-gate CMOS devices and cir- cuits [J]. IEEE Trans on Electron Devices, 2005, 52 (5) : 980-986.
  • 7Chouksey S, Fossum J G. DICE: A beneficial short- channel effect in nanoscale double-gate MOSFETs [J]. IEEE Trans on Electron Devices, 2008, 55 (3): 796 -802.
  • 8Hsu C Y; Lee C C; Lin Y T, et al. Enhanced hole gate direct tunneling current in process- induced uniaxial compressive stress p-MOSFETs [J]. IEEE Trans on Electron Devices, 2009, 56(8) : 1667- 1673.
  • 9甘学温,黄如,刘晓彦等.纳米CMOS器件[M].北京:科学出版社,2004.
  • 10Lee E K F. A low voltage CMOS bandgap reference without using an opamp [ C]// IEEE International Symposium Circuits and Systems,, 2009 :2533- 2536.

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