摘要
玻璃结石是玻璃的一种严重缺陷,不仅影响玻璃制品的外观,而且还会降低玻璃制品的使用价值,若不及时根除会带来极大的经济损失;分析结石的种类、查找结石产生的根源,是消除这种缺陷的关键。利用电子探针分别对含铅水晶玻璃中宏观形态不同的三种玻璃结石进行了背散射电子形貌及化学成分定性和定量分析。结果表明:同以前常用的光学显微镜方法相比,电子探针可以对结石的主要成分进行快速分析,有助于准确推测出结石产生的可能原因,为有效提高玻璃制品的正品率提供了依据。
Glass stones are serious defects which not only affect the appearance of glass products,but also reduce the use in value,if not timely eradication would bring substantial economic losses.In order to eliminate such defects,it is necessary to investigate the chemical composition and microstructure of the glass stones.In this paper, BSE morphologies and chemical composition quantitative and qualitative analysis of the as-observed stones in the lead glass were characterized by electron microprobe analysis（EPMA）,which is a faster and more accurate method comparing with the conventional optical microscopy method.The results will provide the scientific basis for how to avoid these defects during the glass producing process.
出处
《理化检验（物理分册）》
CAS
2010年第4期229-233,共5页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
