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Ⅱ-VI族半导体的掺杂与补偿 被引量:1

DOPING AND COMPENSATION IN II VI SEMICONDUCTORS ①
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摘要 采用离散变分局域密度泛函(DVLDF)方法及团簇模型研究了IIVI族半导体中的掺杂及补偿问题。研究了ZnSe中的N,P,As,F,Cl,Br等杂质不同的结构和电子性质。发现NSe在ZnSe中没有JahnTeler形变,而PSe和AsSe存在这一形变,从而判定N是其中最有效的p型掺杂剂。对于n型的ZnSe,研究发现Cl是最有效的施主杂质。根据对缺陷复合体的计算,发现NSeZnVSe及诸如NSeZnint的多N集团对于p型ZnSe的补偿有着重要作用。研究表明,对于ZnTe来说,Cl不是有效的施主杂质,而N是有效的受主杂质。 Doping and compensation in II VI semiconductors are studied using discrete variational local density functional (DV LDF) method with cluster model. N, P, As, F, Cl, Br and other dopants in ZnSe are studied. The structural and electronic properties are found to be different for them. It is found that there is no Jahn Teller distortion for N Se in ZnSe, while there are Jahn Teller distortions for other dopants such as PSe and AsSe. N is thought to be the most efficient among those dopants for p type ZnSe. As for n type ZnSe, Cl is found to be the most effective donor. Based on the calculation of defect complexes, it is found that N Se Zn V Se and N clusters such as N Se Znint should play important roles for the compensation of p type ZnSe. Cl is found to be an inefficient donor for ZnTe, and N is found to be an efficient acceptor for ZnTe.
出处 《计算机与应用化学》 CAS CSCD 1998年第6期327-332,共6页 Computers and Applied Chemistry
关键词 掺杂 补偿 Ⅱ-Ⅵ族 半导体 DV LDF Doping, Compensation, II VI semiconductors
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参考文献3

  • 1Yao T,J Cryst Growth,1994年,138卷,290页
  • 2Yang J L,Phys Rev B,1994年,49卷,15525页
  • 3Yao T,Jpn J Appl Phys,1986年,25卷,821页

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