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STM腐针电路的研制及实验分析 被引量:2

The Development and Analyse on the Tip Etching Circuit for Scanning Tunneling Microscopy
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摘要 提出一种新的用于制备扫描隧道显微镜(ScanningTunnelingMicroscope,以下简称STM)探针的腐针电路,并利用此电路对影响腐针效果的几个因素进行了研究.得出制备探针的最佳组合条件和方法. A new etching circuit of tips for Scanning Tunneling Microscopy and the experiment about this circuit are reported.By experiment,several factors which affect the curature radius of the tips are analysed.Finally,the best way to make the tips under the concerned conditions is found.
出处 《广西大学学报(自然科学版)》 CAS CSCD 1998年第3期263-268,共6页 Journal of Guangxi University(Natural Science Edition)
基金 广西区教委跨世纪人才工程资助
关键词 探针 制备 扫描隧道显微镜 电化学腐蚀 腐蚀电路 make the tips Scanning Tunneling Microscopy electrochemical etching
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