摘要
在了解国外先进科学级CCD相机的基础上,自主研发一种适合在工业无损检测中使用的相机。做的主要工作是设计和开发了一种面阵CCD驱动电路,介绍了全帧型面阵CCD光电传感器的成像原理、芯片结构、驱动时序的要求。通过分析各个引脚的关系,把用硬件描述语言(VHDL)编写的驱动程序,烧到FPGA芯片EP2C5Q208C8中。仿真结果及其用逻辑分析仪测得的实验结果表明该方法完全满足CCD芯片的要求。该方法能提供多路驱动时序,驱动频率高,硬件电路简单,编程方便,具有较好的性价比和应用推广价值。
In this paper,A new array CCD driver is designed to meet the Nondestructive Testing in Engineering fields and get rid of the disadvantages of the previous. Introduce full frame area array CCD type photoelectric sensor principle, chip structure, the requirements of Timing-driven. By analyzing the relationship between various pin, The use of hardware description language （VHDL） to prepare the driver, through field programmable gate array（FPGA） chip EP2C5Q208C8. The simulation results and the logic analyzer with the measured results show that the method to satisfy the requirements of CCD chips. This method can provide multi-channel-driven timing, high driver frequency, hardware circuit simple, programming convenience, A good cost-effective and application value.
出处
《电子测试》
2010年第2期69-72,共4页
Electronic Test
