摘要
目前,Flash已经在移动存储领域和嵌入式应用系统中成为无可争议的主角。而且随着生产制造成本的不断降低,其应用领域继续快速扩大,已经从数码消费存储领域向海量数码数据存储系统不断挺进。基于SD控制器设计了一个全新的Flash测试系统。在SD控制器中引人了CRC校验、差错控制编码(ECC)、Flash存储器的直接存储访问(DMA)控制等关键技术,保证了存取数据的完整性、通信时数据的可靠性、传输数据的快速性。为了能够实现固件的随时下载更新,重点引入了可下载固件的RISC CPU IP核结构,满足了闪存测试系统功能的不断变化。该测试系统能够完成对闪存进行擦除测试、读写测试以及坏块的检测。
Flash has been became the undisputed protagonists in the field of mobile storage and embedded applications. Moreover, with the continuous production of lower manufacturing costs, and its application areas continue to rapidly expand from the field of digital consumer mass storaget to digital data storage systems. In this paper, design a new FLASH test system based on the SD controller. The introduction of key technologies in SD Controller, such as CRC checksum, Error Control Coding （ECC） and Flash memory Direct Memory Access （DMA）, ensuring the integrity of data, the reliability of data communication, the fast transmission of data. In order to be able to update the firmware at any time , focusing on introducing the RISC CPU IP core structure, which can realize the firmware updates easily, , meet the constantly functions changing of the flash memory test system. This system can realize comprehensive test for Flash, including erasing test, reading and writing tests as well as the bad block detection.
出处
《计算机测量与控制》
CSCD
北大核心
2009年第9期1682-1683,1695,共3页
Computer Measurement &Control
基金
Flash测试系统平台开发
