期刊文献+

工件表面粗糙度的在线测量技术

On-line Measurement of Workpiece Surface Roughness
在线阅读 下载PDF
导出
摘要 提出一种基于激光散射法的在线测量方法,以条形激光光束作为光源照射被测物表面,然后用配有高倍率镜头的工业相机采集散射光的图像,最后通过计算机数据处理得到表面粗糙度值。实验证明,该测量方法具有测量速度快、仪器结构简单、非接触且能直观显示被测工件的表面形貌等优点。 This paper present a kind of on-line measurement based on laser light scattering. In the measurement, the surface of workpiece is irradiated by laser beam as light source, then the scattered image is token by industry camera with high magnification lens. Lsatly, the value of roughness can be worked out by computer processing. The experimental results show this metod has several excellence as follows: rapidity, simple configuration, non-contact, display surface's figure on screen.
作者 马程 王骏武
出处 《中国仪器仪表》 2009年第8期67-69,共3页 China Instrumentation
关键词 表面粗糙度 在线测量 激光散射 图像处理 Surface roughness On-line measurement Laser scattering Image processing
  • 相关文献

参考文献5

  • 1付风岚,谭海艳.零件表面粗糙度的激光在线测量[J].激光与红外,2007,37(5):412-414. 被引量:4
  • 2李喜德,施惠基.器件表面形貌及粗糙度检测[J].实验力学,2006,21(2):111-121. 被引量:4
  • 3Lu R and Tian G. On-line surface roughness measurement by laser light scattering[J], Measurement Science and Technology, Vol.17, 2006, pp.1496-1502.
  • 4Tian G and Lu R. Surface measurement using active vision and light scattering[J], Optics and Lasers in Engineering, Vol. 45, No. 1, 2007, pp. 131-139.
  • 5Gonzalenz R,Woods R,Eddinss著,阮秋琦等译.数字图像处理(MATLAB版)[M].北京:电子工业出版社,2005:64-70.

二级参考文献66

  • 1胡曙光,陈静,华艳秋,王明辉.基于激光三角法的传感器设计[J].测控技术,2006,25(6):7-8. 被引量:16
  • 2[17]Windecker R,Tiziani H J.Optical roughness measurements using extended white-light interferometry[J].Optical Engineering,1999,38(6):1081~1087.
  • 3[18]Holme B.Studying changes in surface topography by white light interferometry[C].TMS Annual Meeting,2002,205~210.
  • 4[19]Pavlicek P.Height profile measurement by means of white light interferometry[C].SPIE,2003,5259:139~144.
  • 5[20]Dufour M L,Gauthier B.Precise surface profilometry based on low coherence interferometry[C].SPIE,2003,5260:173~178.
  • 6[21]Kim G,Kim S.White light scanning interferometry for thickness measurement of thin film layers[C].SPIE,1993,783:239~246.
  • 7[22]Pramod K R.Optical measurement techniques and applications[M].Boston,Artech House,1997.
  • 8[23]Onuma K,Tsukamot K.In situ study of surface phenomena by real time phase shift interferometry[J].Journal of Crystal Growth,1994,137(3-4):610~622.
  • 9[24]McMackin L.Scalable surface profiling using multi-wavelength heterodyne interferometry[C].SPIE,2003,5162:183~193.
  • 10[25]Lu G,Wu S,Palmer N,et al.Application of phase shift optical triangulation to precision gear gauging[C].SPIE,1998,3520:52~63.

共引文献6

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部