摘要
描述了一种微束微区X荧光探针分析仪,它采用会聚X光透镜来聚焦入射X射线,可对样品内微小面积的元素及其含量进行分析。以铁矿石内颗粒的测量为例,表明了微束微区X荧光探针分析仪是区分矿石中微小颗粒的有力工具,在细微材料成分分析和无损检测中具有广阔的前景。
It describes a kind of Micro-beam Micro-district X fluorescent probe analyzer, which use convergence X-ray lens to focus incidence X-ray, and which can analyze the elements and their content of small area in the sample. To measure iron ore particles as an example to show the analyzer is a powerful tool for distinguish small particles of ore. And the analyzer will have a broad prospects in analysis of the subtle material composition and non-destructive testing.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2009年第4期828-831,共4页
Nuclear Electronics & Detection Technology
基金
中国地质调查项目
CS编号12120107605017
关键词
微束微区
X荧光探针
会聚X光透镜
微小颗粒
Micro-beam Micro-district , X fluorescence probe , Convergence X-ray lens , tiny particles
