期刊文献+

声表面波气敏传感器敏感薄膜厚度的研究 被引量:2

Study on the Thickness of Sensitive Layer of Surface Acoustic Wave Gas Sensor
在线阅读 下载PDF
导出
摘要 理论上研究了声表面波气敏传感器敏感薄膜厚度对系统灵敏度的影响。分析了气体浓度、敏感薄膜厚度、敏感薄膜密度对系统灵敏度的共同影响。提出了最佳薄膜厚度的概念,并给出了相应的关系式。 Influence of sensitive layer of surface acoustic wave sensor on the sensitivity of system was researched theoretically. Total influence of gas concentration, thickness and density of sensitive layer to the sensitivity of system was also analyzed. Then the idea of optimization of the layer thickness was proposed and the corresponding formulas were presented.
出处 《压电与声光》 CAS CSCD 北大核心 2009年第4期461-463,共3页 Piezoelectrics & Acoustooptics
基金 国家自然科学基金资助项目(60572018) 天津市科技发展计划科技攻关基金资助项目(05YFGPGX04900)
关键词 声表面波 敏感薄膜 最佳薄膜厚度 surface acoustic wave sensitive layer optimal layer thickness
  • 相关文献

参考文献5

二级参考文献109

共引文献41

同被引文献25

  • 1曹汉强,朱光喜,李旭涛,夏文芳.多重分形及其在地形特征分析中的应用[J].北京航空航天大学学报,2004,30(12):1182-1185. 被引量:18
  • 2邵元智,钟伟荣,任山,蔡志苏,龚雷.纳米团聚生长的多重分形谱[J].物理学报,2005,54(7):3290-3296. 被引量:10
  • 3Karfer M, Parisi G, Zhang Y C. Dynamic scaling of growing interfaces[J].Phys. Rev. Lett. , 1986,56(9) :889-893.
  • 4林砺宗 宁宗奇 林万勇.同位素薄膜厚度在线测量系统.自动化测试,16(7):952-955.
  • 5Oguz Koysal, Duygu Onal, Serhat Ozder, et al. Thickness measurement of dielectric films by wavelength scanning method [ J]. Optics Communications, 2002,205 ( 1 ) : 1-6.
  • 6Sinha Pranay G, Xiong Xiangchun. Wet/Dry film thickness measurement of paint by absorption speetroscopy with acousto-optie tunable filter spectrometer [ C]//Proeeedings of SHE the International Society for Optical Engineering. 2005 : 5880.
  • 7Hwang Y M,Lee J S, Pahk H J. New method of thin-film thickness measurement in wavelength scanning interferometry [ C ]//Proceedings of SPIE The International Society for Optical Engineering, 2005:7130.
  • 8Shukla R P,Udupa D V, Das N C, et al. Non-destructive thickness measurement of dichromated gelatin films deposited on glass plates [J]. Optics & Laser Technology, 2006,38(7) : 552-557.
  • 9Chien Chou, Hui-Kang Teng, Chih-Jen Yu, et al. Polarization modulation imaging ellipsometry for thin film thickness measurement [J].Optics Communications, 2007,273 ( 1 ) : 74-83.
  • 10Young-Min Hwang, Sung-Won Yoon, Jung-Hwan Kim, et al. Thin- film thickness profile measurement using wavelet transform in wavelength-scanning interferometry [ J ]. Optics and Lasers in Engineering, 2008,46 (2) : 179-184.

引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部