摘要
本文在EM-400T透射电子显微镜上测定了不同含量稀土铝试样的膜厚.同时考虑到难于选择适当的操作矢量g_(hkl),使所有位错参与成象.因此,拍摄了一条系列照片,每张照片用一个强反射.尽量减少不可见位错的影响,按割线法计算出不同试样的位错密度.
The measurement of foil thichness with converging beam diffraction has the following abvantage:the measurement thickness is the one in the direction of electronic beam and the measurment of foil thickness is critical to the calculation of dislocation density using EM-400T transmission electron microscope. The thickness measurement of rare earth aluminium samples of different contents is studied in this paper.In the meantime considering the difficulty in choosing proper worker vectors to make all the dislocations take part in image formation,we have taken a number of photographs, all of which are of strong reflection. The influence of invisible dislocations being lessened as far as possible the dislocation densities of different samples are worked out with the secant methed.
关键词
铝
稀土
位错密度
测定
显微镜
converging beam diffraction
transmission electron microscope
worker vector dislocation
