摘要
在闪烁体耐辐照特性研究中,通过比较闪烁体受辐照前后闪烁探测器系统灵敏度的变化,说明在大辐照剂量后闪烁探测器是否处于正常工作状态。利用三通道脉冲X射线源(平均能量800keV)、DPF脉冲中子源(D-T中子能量14.4MeV),通过实验标定几种常用闪烁探测器对脉冲中子、脉冲X射线的相对灵敏度值。所用闪烁体包括40mm,不同厚度的CeF3,NaI(Tl)和BaF2等无机晶体及ST-401,ST-1422,NE111等塑料闪烁体。
In the study of scintillator irradiation resistibility, by the sensitivity comparison between the magnitude before and after γ irradiation, we can make sure if the scintillator detector can work normally after the large exposure dose. Base on the experiment using three-channels pulse λ source and DPF pulse neutron source, this paper gives the relative sensitivity of some common scintillation detector on condition of pulse neutron and pulse X-ray beam. The scintillator contains inorganic crystals as CeF3, NaI（T1）, BaF2 and organic plastic scintillator such as ST-401 ,ST-1422 and NE111.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2009年第3期600-602,632,共4页
Nuclear Electronics & Detection Technology
基金
中国工程物理研究院科学技术基金资助(20060211)
关键词
闪烁探测器
灵敏度
Γ辐照
脉冲辐射
scintillator detector, sensitivity, γ irradiation, pulse radiation
