摘要
介绍了冲洗色谱特征点法（ＥＣＰ）测定５Ａ分子筛的比表面积，并用Ｌａｎｇｍｕｉｒ吸附等温方程代替传统的ＢＥＴ方程拟合计算比表面积。用该法测定５Ａ分子筛及其失效和再生后的比表面积，取得满意的结果，并与热脱附法对比，测定结果无显著性差异，表明该法测定５Ａ分子筛比表面积简单可行。
In this paper,elution by characteristic point(ECP)was used to measure the specific surface area(SSA)of 5A molecular sieves,and Langmuir isotherm equation instead of BET equation was used to calculate SSA.The SSA of deactive and regenerative 5A molecular sieves were measured by this method.The results were almost equal to those measured by heating desorption.It was shown that this method was simple and feasible.
出处
《分析测试学报》
CAS
CSCD
1998年第3期71-74,共4页
Journal of Instrumental Analysis
基金
中国石化总公司资助
关键词
比表面积
分子筛
ECP
5A分子筛
测定
Elution by characteristic point(ECP),Specific surface area, molecular sieve
