摘要
对高速数字电路相位噪声测试技术进行了探索。利用直接频谱仪法、鉴相器法、鉴频器法等相位噪声测试方法,通过阻抗匹配等合理的测试设计,开发出测试系统,对高速数字电路相位噪声进行了测试研究,获得了准确的测试数据,有效地表征了电路实际性能。
An investigation was made into techniques for testing phase noise of high-speed digital ICs. Using several phase noise test methods, such as direct spectrum analyzer, phase detector and frequency detector methods, a test system was developed, through reasonable test design, such as impedance matching, to study phase noise of high-speed digital ICs, and accurate test data were obtained, which correctly characterize performance of ICs under test.
出处
《微电子学》
CAS
CSCD
北大核心
2009年第3期324-327,共4页
Microelectronics
基金
模拟集成电路国家级重点实验室基金资助项目(9140A08020207DZ3401)
关键词
数字电路
相位噪声
鉴相器
鉴频器
阻抗匹配
Digital IC
Phase noise
Phase detector
Frequency detector
Impedance matching
