Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation 被引量：2

Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation

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摘要 The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS85 and 74-series circuits. The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS85 and 74-series circuits.

作者王真江建慧杨光

机构地区 Key Laboratory of Embedded Systems and Service Computing Department of Computer Science and Technology

出处《Tsinghua Science and Technology》 SCIE EI CAS 2007年第S1期32-38,共7页 清华大学学报（自然科学版（英文版）

基金 the National Basic Research and Development (973) Program of China (No. 2005CB321604) the National Natural Science Foundation of China (No. 90207021)

关键词 soft error soft error rate signal reliability failure probability reliability estimation soft error soft error rate signal reliability failure probability reliability estimation

分类号 TN791 [电子电信—电路与系统]

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