摘要
用Ｘ衍射线形分析法测定了Ｆｅ－３０．３％Ｍｎ－６．１％Ｓｉ（质量分数）形状记忆合金经不同温度淬火和经退火后的层错几率Ｐｓｆ．研究了淬火空位、层错几率与马氏体相变点Ｍｓ的关系．结果表明，增加淬火空位将促进层错的形成，使Ｍｓ提高；且Ｍｓ与１／Ｐｓｆ呈线性关系．对可能的机理进行了讨论．
The stacking fault probabilities of an Fe 30.3 wt%Mn 6.1 wt%Si SMA for the states of quenching at different austenizing temperature and the state of annealing are measured by X ray diffraction profile analysis. The relationship between the quenched in vacancies, the stacking fault probability and the transformation point of ε martensite, M s, is revealed. The results show that increasing the quenched in vacancies will promote the formation of stacking faults and to enhance the M s temperature. The linear relationship between M s and P sf is as follows: M s=330.7-0.405/ P sf (K). The possible mechanism is discussed.
出处
《上海交通大学学报》
EI
CAS
CSCD
北大核心
1998年第2期45-48,共4页
Journal of Shanghai Jiaotong University
基金
国家自然科学基金
关键词
形状记忆合金
层错几率
淬火空位
ε-马氏体相变点
shape memory alloy
stacking fault probability
quenched in vacancies
ε martensite transformation temperature
