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定偏心锡磨盘超精密平面抛光均匀去除模拟计算(Ⅰ) 被引量:11

Simulation of Even Material Removal During Eccentric Plane Polishing by a Tin Polisher
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摘要 定偏心平面抛光中,工件表面各区域材料的均匀去除问题涉及工件加工后的面形。本文从理论上讨论了锡磨盘与工件的转速比、偏心距及转速对工件表面面形的影响,以及工件边缘露出磨盘的情况下,表面的不均匀去除程度。模拟计算结果表明当转速比为1,工件不露出磨盘时,可以实现工件材料的均匀去除。 The even material removal in the contacting area between the surfaces of polisher and the samples being finished is important for the surface contour of the samples after polishing. This paper analyzes the differences of material removal of different positions on the sample surfaces theoretically as a function of rotating ratio of sample holder and main spindle, eccentric distance and rotating velocity. The edge effect when part of the sample surfaces do not keep in contact with the polisher continuously is discussed. The simulation shows that even material removal can be achieved while the rotating ratio is 1, and every position of sample surfaces keep touching the polisher during polishing.
出处 《光学精密工程》 EI CAS CSCD 1998年第2期77-82,共6页 Optics and Precision Engineering
关键词 抛光 超精密加工 光学平面 定偏心平面抛光 Tin, Polishing, Precision manufacture, Plane
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参考文献6

  • 1裴庆魁,高宏刚.平面高速精磨中的均匀磨削[J].光学机械,1991(4):27-31. 被引量:2
  • 2裴庆魁,光学机械,1986年,4期,27页
  • 3查立豫,仪器制造,1983年,3期,6页
  • 4曹天宁,光学零件制造工艺学,1981年
  • 5李懋和,长春光学精密机械学院学报,1979年,2期,72页
  • 6王长兴,长春光学精密机械学院学报,1978年,创刊号,46页

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