摘要
用增长率方法测量了6～30keVHe+，Ne+，Ar+，Kr+，Xe+及CI+离子与H2分子碰撞的单电子剥离截面．He+的截面数据与他人数据一致，其他的截面数据在此之前未见报道．
The single-electron loss cross sections for 6~30 keV He+, Ne+, Ar+, Kr+, Xe+ and Cl+ impacting on H2 were measured using the growth-rate method. The present cross-section data of He+ are in good agreement with others' measurements. The other cross-section data of this work are reported for the first time.
出处
《复旦学报（自然科学版）》
CAS
CSCD
北大核心
1998年第1期8-12,共5页
Journal of Fudan University：Natural Science
基金
国家自然科学基金
国家教委留学回国人员科研基金
关键词
电子剥离截面
低能离子
测量
氢分子
碰撞
electron-loss cross section
low-energy ions
growth-rate method
