摘要
利用光学干涉法对晶体生长过程中所引起的溶液折射率微小变化进行监测,分析所采集到的干涉图像,可得出与光程差相关的溶液浓度场及温度场的精确分布、晶体微观形貌变化及溶液对流等信息,对晶体生长机理研究有重要的意义。回顾了干涉技术测量晶体生长参数的基本原理,同时综述了近年来干涉技术在晶体生长研究中的应用及发现,并分析了该技术在晶体生长研究领域中的发展方向。
The optical interferometrie method can be used to monitor the optical path change of the media through which the light beam passed. By analyzing the information of interference fringes obtained during the crystal growth from solution, the parameters related with the optical path difference, such as the crystal growth rate, the concentration distribution around the crystals, and the temperature profile, can be derived. These parameters are important for understanding the mechanism of the processes of the crystallization. Therefore the interferometric method has become a powerful tool for studying the crystal growth. In this paper, the measurement principle and recent applications of the interferometric method in the field of crystal growth are reviewed, and the future trends in this field are discussed.
出处
《材料导报》
EI
CAS
CSCD
北大核心
2009年第3期77-81,共5页
Materials Reports
基金
国家自然科学基金(30570384
10772150)
教育部"新世纪优秀人才"项目(NCET-06-0885)
西北工业大学基金科学研究基金重点项目
关键词
晶体生长
干涉法
晶体微观形貌
生长机理
crystal growth, interferometric method, surface micro-morphology, growth mechanism
