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薄型QFP封装热传仿真分析

Numerical Thermal Analysis for Low-profde QFP
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摘要 文章采用有限元数值模拟方法,对薄型引脚式表面贴装QFP封装元件的详细模型进行数值模拟,分析了各种因素对封装体热阻的影响。结果表明:采用高导热印刷电路板,封装体热性能得到较大提高,θ_(JA)为35.74℃/W,但是不同类型的电路板对θ_(JC)的影响不大。随着气流流速增大,高导热印刷电路板上封装体的θ_(JA)由35.74℃/W降低至24.06℃/W,显示出极好的热传特性,并且当气流流速增大到一定程度时,θ_(JA)值趋于稳定。真实功率载荷条件下,该封装元件中芯片的最大等效应力为70.2 MPa,低于芯片的最大断裂强度,并且其水平面的最大剪应力仅为25 MPa,不会造成芯片和粘结层以及塑封层之间的分层破坏。 In this paper, a detailed low-profile QFP model was analyzed by the numerical simulation method, involved with different influencing factors of thermal properties. The simulating results show that using multi-layer Test Board is a perfect way to improve package's thermal performance, its theta JA is 35.74℃ / W, but different test board has little effect on theta JC; as forced air velocity increased, theta JA reduces from 35.74℃/W to 24.06℃/W, and when the velocity is increased to some extent, theta JA would not change anymore; applying the real power to the package, the maximum von mises stress and shear stress of the die is 70.2 MPa and 25 MPa, which is allowed, and would not cause the package and its die to be destroyed.
出处 《电子与封装》 2008年第11期1-4,共4页 Electronics & Packaging
关键词 电子封装 数值模拟 热-结构性能 electronic packaging numerical analysis thermal-structural properties
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  • 1许杨剑,刘勇,梁利华,余丹铭.芯片叠层球栅阵列尺寸封装的焊球疲劳寿命预测[J].浙江工业大学学报,2004,32(6):668-673. 被引量:8
  • 2顾靖,王珺,陆震,俞宏坤,肖斐.芯片叠层封装的失效分析和热应力模拟[J].Journal of Semiconductors,2005,26(6):1273-1277. 被引量:24
  • 3DARBHA K,DASGUPTA A.Nested Finite Element Methodology for Stress Analysis of Electronic Products[J].ASME Transactions in Electronic Packaging,1997,114(6):152-160.
  • 4WILDE J.An Integrated Design Approach for the Hardware Optimizetion of Electrical Power Modules for Automotive Electrotraction[J].ASME Electron Packag,1995,8(4):120-125.
  • 5ATTARWALA A L,TIEN J K,MASADA G Y.Confirmation of Creep and Fatigue Damage in Pb/Sn Solder Joints[J].Electron Package,1992.114(2):109-111.
  • 6PAO Y H.A Fracture Mechanics Approach to Thermal Fatigue Life Prediction of Solder Joints[J].IEEE CHMT,1992,15(4):559-570.

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